The investigation tests of the integrated circuits

The article deals with the information of the investigation tests assignment, development of the investigation tests program of the integrated circuits. The communication of teaching experiment and investigation tests is specified. The most important stages of the teaching experiment method are given. Tasks of each stage of the method are marked. The major destabilizing factors influencing on the integrated circuits operation are stated. On the example of the integrated circuits 765LN2-1 selection the application of the test program is shown, the studied parameters are determined, the most informative parameters are set. The block diagrams of the most informative parameters measurements are provided. Mathematical models of personal forecasting for the researched selection on the basis of the received test results are given.